The NARL-ITRC researchers, Tzu-Hsuan Wei (left) and Shih-Feng Tseng (right), honored at the IENA 2009 in Nuremberg, Germany.

Recently, the international expert jury of the 61st IENA Nuremberg–"Ideas-Inventions-Innovations" honored two inventions presented by the NARL's Instrument Technology Research Center (ITRC) with gold medals. 

The IENA is the world's leading forum for the marketing of inventions and product innovations. And the 2009 event, held at the Nuremberg Exhibition Centre from 5-8 November, drew more than 800 presented inventions from 34 countries and specialized visitors from 44 countries. In total, the international expert jury awarded 67 gold medals to the top inventions.

The titles of the two honored inventions from the NARL-ITRC were: 1) the chip defects inspection device and inspection method; and 2) the lens measurement device and method for measuring lens.

The first invention adopts a self-developed data determination model to replace the conventional defect inspection method. The advantage of this new method is that it only requires a short inspection time, and the chip modules under inspection do not need precise positioning, which will significantly reduce the cost in chip production. This new method is to help the semiconductor company in rejecting defective products more efficiently, hence, impROVing the production yield as well as the product competitiveness.

The second invention, in collaboration with Chien-Ching Ma, professor in mechanical engineering from National Taiwan University, adopts the principle of light polarization. A quick way for measuring the decenter and the tilt of lens is pROVided with the combination of automated optical inspection and the image processing technique. The method can be applied to the high yielding production of plastic injection and glass molding lens.